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Curve tracer tracing - Using our long established relationships within the worldwide Industry we bring the newest and most technologically advanced products to the European Microelectronics Community. Sometimes we work with small startups; in other cases we work with suppliers who have been in existence as long as we have. In any case we have a simple and clear objective – to match the capabilities of these products with the needs of our customer base.

Curve tracer tracing - Technology produced by The Semiconductor Business Unit at Applied Precision. Our products enable improved card development and repair, increased semiconductor yields, and reduced cost of operations. Anchored by our PrecisionPoint line of Applied Precision is continuing our tradition of technology and market leadership in both probe card

Applied Precision's microBurst Contact Resistance Reduction System uses a non-contact, non-destructive, fully automated cleaning method to remove oxidation and particulates. Thin films, including oxides, and particulates cause contact resistance, which can lead to inaccurate testing and reduced yield. The microBurst system creates hypervelocity microclusters, which remove particulates and oxides through the transference of impulsive forces to the probe tip surface without physically contacting it and causing probe tip alignment, planarity or topography changes. The results can be seen in improved quality of wafer test, increased probe card life and better control of the probe card in the probing process.

Applied Precision's waferWoRx™ Probing Process Analysis System enables automated root cause analysis for rapid corrective action, yield optimization and control, and new technology validation for the wafer probing process. The waferWoRx system thoroughly analyzes the wafer's probe marks to reveal the true performance under actual test conditions of the prober, probe card and probe card analyzer. The waferWoRx system replaces time-consuming manual analysis with automatic analysis based on proprietary algorithms. The system collects quantifiable data and delivers an easy-to-read process report card. With the root cause(s) defined, the user's efforts can be focused on rapid corrective action that can optimize probing performance and ultimately increase efficiency of the wafer test floor.

The waferWoRx Probing Process Analysis System has been recognized by Semiconductor International magazine as an "Editors' Choice Best Product" for the year 2000.

The new "Platform 2" core technology, combined with precision vision and systems control, and innovative applications software, enables PrecisionPoint Probe Card Analyzers to produce both dramatically improved process tolerances and increased productivity.

The newly-introduced Extension option for the PrecisionPoint VX2 Probe Card Analyzer has the highest channel count (4500) and probe test capability (8000) of any probe card analyzer on the market, enabling efficient and extremely accurate testing of next-generation, ASIC and advanced memory multi-DUT probe cards.

We have a small team of very experienced administrators who handle all sales and marketing activities. We invest heavily in our business systems and technology to maintain the highest level of reliability in our record keeping and communications.