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Qcept Technologies is the world leader in Non-Visual Defect (NVD) inspection.

 

Our ChemetriQ® inspection systems enable fabs to improve yield by detecting Non-Visual Defects (NVD), sub-monolayer metallic and organic contamination, and other yield-killing surface non-uniformities that cannot be seen by optical tools.

 

 

 

 

 

 

 

 

 

        

Qcept ChemetriQ® Series Wafer Inspection System 

 

 

Image created on ChemetriQ® 3000 inspection system showing organic residues which could not be detected by any other method.