Solar Metrology was created to address the metrology needs of

the rapidly growing Solar PV electric industry. Our team of scientists, engineers, applications specialists and support personnel is the most experienced in the XRF thin film measurement industry, with an over 20-year track record of technical innovation and dedicated customer service.

 

 

SMX-BEN bench top tools (right) are ideal for R&D, process development and failure analysis. SMX-BEN facilitates material selection and recipe formulation in a pre- or early production ramp phase, and supports your SMX in-process tools well into capacity production.

 

 

 

SMX-ILH is designed for in-line, post-process atmospheric measurement, enabling control and adjustment of film composition and thickness in real time. SMX-ILH can accommodate flexible (stainless steel and polyimide) and rigid glass substrates; measurements can be performed on stationary or moving substrates for control of blanket or patterned films.

 

 

 

 

 

 

SMX-ISI is installed in the clean vacuum section of a line or tool to enable control and yield management of glass or web deposition processes. Solar Metrology offers SMX-ISI configurations for both static point measurement and multiple cross-process flow gradient analysis.

 

Please contact us for more information!