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Meridian Adhesives Group Acquires Adhesive/Dispensing-Related Business

We would like to inform you that the "Adhesive/Dispensing" business of the John P. Kummer Group has been acquired by the Meridian Adhesives Group and will in due course be merged into Epoxy Technology Europe GmbH.

While you will have continued access to the EPO-TEK product line, we are pleased to offer the expanded product portfolio of the Meridian Adhesives Group in the near future.

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COVID-19 Information

Dear Valued Customers and Business Partners
 
Our companies are following the current recommendations from respective national and local governments related to alleviating the spread of Coronavirus. We have established a policy and guidelines with regards to travel as well as leisure activities and personal hygiene.
 
This also means that our employees will be modifying their work patterns for the time being – we have asked that employees where possible should work from home.
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40 Years

Today the John P. Kummer GmbH has its 40th anniversary.
We want to thank all our business partners who have accompanied us on our way to get a successful and trusting company!
Special thanks to our customers for your trust and longterm cooperation!
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DOUBLE-SIDED WAFER PROBERS

Our range of double-sided probing systems is designed for wafer sizes up to 200 mm (8″) and is ideal for testing power semiconductor devices such as MOSFETs and IGBTs at wafer level. We offer a choice of fully automatic and semi-automatic double-sided wafer probe stations. Both can be customized to suit a wide range of probing applications.

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PEGASUS™ M200FA & M300FA

MANUAL ANALYTICAL PROBE STATIONS FOR 200 MM AND 300 MM WAFERS

Wentworth’s manual FA series wafer probers M200FA and M300FA enable you to quickly obtain accurate measurements. At the core of this series is a highly stable, feature-laden platform to capture repeatable, precision measurements.

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PEGASUS™ S200FA & S300FA

SEMI-AUTOMATIC ANALYTICAL PROBE STATIONS FOR 200 MM AND 300 MM WAFERS

Pegasus™ FA series semi-automatic wafer probers offer a remarkably versatile probing platform, designed specifically for failure analysis applications, device characterization, DC, low leakage, high voltage, radio frequency, microwave, die probing, low volume wafer probing and ultra-fine geometries at die level. 

For testing of high voltage semiconductor power devices, we offer a specially configured solution, the S200FA-HV wafer prober.

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