VLSI Standards, Inc. was founded in 1984 in Mountain View, California for the purpose of developing measurement standards and associated services for the semiconductor and metrology related industries. VLSI Standards' first products were a NIST traceable Step Height Standard, and a line of Contamination Standards. Today, in our class I fabrication facility, along with offices in the US and Japan, VLSI Standards provides dozens of standards, products, and services to address every aspect of instrument calibration in the semiconductor and other industries requiring precise metrology.

ULTRA TEC designs, manufactures and provides advanced surface & sample preparation equipment and consumables for both routine and custom applications in a multitude of industrial settings. They offer solutions for development, analytical and research environments, right up to production.

http://www.ultratecusa.com/

SELA develops and adapts technologies to provide roadmap solutions for physical failure analysis and characterization.

SELA offers a modular suite of tools for cost-effective material and root-cause failure analysis as from 1991.

SELA’s products incorporate unique technologies and IPs that solve bottlenecks in the failure analysis and sample preparation for wide variety of requirements.

www.sela.com

OKOS SUCCESS STORY  

Starting in 1998, OKOS has developed breakthrough SAM technologies that are in many systems all over the world.

Since 2005, OKOS has grown year over year and currently maintains operations and customers throughout North America, Asia and Europe.

Through our proprietary architecture, we are the premier solutions provider of SAM systems and instrumentation worldwide.