Our range of double-sided probing systems is designed for wafer sizes up to 200 mm (8″) and is ideal for testing power semiconductor devices such as MOSFETs and IGBTs at wafer level. We offer a choice of fully automatic and semi-automatic double-sided wafer probe stations. Both can be customized to suit a wide range of probing applications.

MANUAL ANALYTICAL PROBE STATIONS FOR 200 MM AND 300 MM WAFERS

Wentworth’s manual FA series wafer probers M200FA and M300FA enable you to quickly obtain accurate measurements. At the core of this series is a highly stable, feature-laden platform to capture repeatable, precision measurements.

SEMI-AUTOMATIC ANALYTICAL PROBE STATIONS FOR 200 MM AND 300 MM WAFERS

Pegasus™ FA series semi-automatic wafer probers offer a remarkably versatile probing platform, designed specifically for failure analysis applications, device characterization, DC, low leakage, high voltage, radio frequency, microwave, die probing, low volume wafer probing and ultra-fine geometries at die level. 

For testing of high voltage semiconductor power devices, we offer a specially configured solution, the S200FA-HV wafer prober.