„Kleben ist eine Schlüsseltechnologie und nimmt als Verbindungstechnik eine zunehmende Bedeutung ein.“
The Viscom X-ray system X8011-III is designed as a team player for individual and reliable use for 2D and 3D X-ray inspection. Thanks to its innovative and simple system operation, the system can be used for manual and automatic X-ray inspection of components, assemblies during production, quality assurance and development – thereby making a sustainable and result-oriented contribution to cost optimization, process reliability and increased product quality.
In the pursuit of excellence, precision is non-negotiable. With the iX7059 One, precision is not just a goal; it is a guarantee. Equipped with state-of-the-art imaging capabilities, this system delivers unrivaled image quality down to an astonishing 1μm resolution.
With the iS6059 Wire Bond Inspection system, Viscom offers the best inline technology and top performance for the automatic optical inspection of wire bonds. Where high throughput is a must, dual-track operations can significantly cut inspection times. The system is particularly easy to configure beyond standard specifications to meet customer-specific needs.
Unique Atomic Force Microscope LiteScope is designed to merge the strengths of AFM and SEM techniques, resulting in effective workflow and extending the possibilities of corr
NenoVision is combining a long tradition of scientific instrument development with leading innovations in the industry. They are pioneers of in-situ correlative microscopy, developing and producing the unique AFM-in-SEM LiteScope.
Solutions and systems for all inspection tasks in the electronics industry
JP Kummer ist ab sofort für VISCOM in der D-A-CH Region für die Semiconductor Industrie aktiv. VISCOM’s AOX/AOI Systeme bieten Lösungen für die Bereiche Advanced Assembly, Power Moudules und Semicondutor.
JP Kummer ist ab sofort in der D-A-CH Region für NenoVision aktiv. Dieser Hersteller bietet das LiteScope an, eine AFM-in-SEM in-situ Lösung für die elektrische und topografische Charakterisierung von Halbleiterkomponenten im Nanobereich.
State-of-the-Art Slot-die Coater for Advanced Thin-Film Applications