SEMI-AUTOMATIC ANALYTICAL PROBE STATIONS FOR 200 MM AND 300 MM WAFERS

Pegasus™ FA series semi-automatic wafer probers offer a remarkably versatile probing platform, designed specifically for failure analysis applications, device characterization, DC, low leakage, high voltage, radio frequency, microwave, die probing, low volume wafer probing and ultra-fine geometries at die level. 

For testing of high voltage semiconductor power devices, we offer a specially configured solution, the S200FA-HV wafer prober.

The 7050 Pick & Place system is used to handle small parts. Equipped with a pressure regulator and pressure gauge, the vacuum-suck function can be adjusted to the components accordingly.

____________________________________________________________________________________________________________________

A foot switch activates the system and the vacuum probe can be used to raise and lower components.

The TP-50 shows its strengths especially with low-viscosity materials such as acrylates, anaerobic adhesives, oils, solvents, fluxes or aqueous solutions.

______________________________________________________________________________________________________________________

The digitally installed air-pressure control-circuit in this system allows for a finer dispense process by a factor 100 (in comparison to purely electro-pneumatic models).

_________________________________________________________________________________________________________________