Our range of double-sided probing systems is designed for wafer sizes up to 200 mm (8″) and is ideal for testing power semiconductor devices such as MOSFETs and IGBTs at wafer level. We offer a choice of fully automatic and semi-automatic double-sided wafer probe stations. Both can be customized to suit a wide range of probing applications.
Wentworth’s manual FA series wafer probers M200FA and M300FA enable you to quickly obtain accurate measurements. At the core of this series is a highly stable, feature-laden platform to capture repeatable, precision measurements.
Pegasus™ FA series semi-automatic wafer probers offer a remarkably versatile probing platform, designed specifically for failure analysis applications, device characterization, DC, low leakage, high voltage, radio frequency, microwave, die probing, low volume wafer probing and ultra-fine geometries at die level.
For testing of high voltage semiconductor power devices, we offer a specially configured solution, the S200FA-HV wafer prober.
The John P. Kummer GmbH is glad to introduce our new partner Wentworth Laboratories.
For further information please contact us.
Find more inforamtion here
We are glad to introduce our new partner GNR srl - Analytical Instruments Group
GNR develops, manufactures and distributes world-wide optical emission spectrometers, x-ray diffractometers and x-ray fluorescence instruments.
We are looking forward to present this to our customers.