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YXLON International GmbH

Worldwide, YXLON International is the leading provider of X-ray inspection equipment for industrial applications. Whether operated manually, semi-automatically or on a fully automatic scale, we have the right solution to match nearly every application. For us, the highest priority is placed on quality: the quality of our inspection systems and, as a result, the quality of your products.


VLSI Standards, Inc.

VLSI Standards, Inc. was founded in 1984 in Mountain View, California for the purpose of developing measurement standards and associated services for the semiconductor and metrology related industries. VLSI Standards' first products were a NIST traceable Step Height Standard, and a line of Contamination Standards. Today, in our class I fabrication facility, along with offices in the US and Japan, VLSI Standards provides dozens of standards, products, and services to address every aspect of instrument calibration in the semiconductor and other industries requiring precise metrology.


SELA Solutions EnabLing nano Analysis Ltd.

SELA develops and adapts technologies to provide roadmap solutions for physical failure analysis and characterization.

SELA offers a modular suite of tools for cost-effective material and root-cause failure analysis as from 1991.

SELA’s products incorporate unique technologies and IPs that solve bottlenecks in the failure analysis and sample preparation for wide variety of requirements.


Rudolph Technologies Inc.

Rudolph Technologies, Inc. is a worldwide leader in the design, development, manufacture and support of defect inspection, advanced packaging lithography, process control metrology, and data analysis systems and software used by microelectronic device manufacturers worldwide.